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WaveScope Wavefront Sensor
Detailed Product Description

Our WaveScope® wavefront sensor performs the same measurements traditionally made by beam profilers and interferometers. Unlike interferometers however, WaveScope does not require a coherent monochromatic light source and is vibration insensitive. The system calculates all common optical parameters using powerful proprietary software. Since WaveScope needs no internal light source, it can directly measure the characteristics of your laser, light source or optical system.

How it Works

WaveScope uses a modified Shack-Hartmann technique to measure the gradient of a wavefront.

A two-dimensional lens array divides the incoming wavefront into an array of spatial samples called subapertures. Light from these subapertures is brought to a focus behind the array on a CCD camera. The lateral position of the focus spots depends on the local tilt of the wavefront.

A change in the gradient of the wavefront across a subaperture, will produce a shift in the position of the spots. By measuring the shift of the spots, the gradient of the incoming wavefront can be calculated.

In a conventional Shack-Hartmann sensor, when the local tilt is large enough to move the focus spot into the field of the next subaperture, an ambiguity arises as to the origin of the spot. This severely limits the dynamic range of the measurement.

Large Dynamic Range

WaveScope resolves this ambiguity by moving the camera to trace the path of the spots during calibration. This is how WaveScope measures aberrations of many hundreds of waves with fractional wave accuracy. Additionally, the ability to move the camera allows imaging of the entrance pupil at the lenslet array, providing an invaluable aid in alignment.
Note: This feature is not available in the CUFS-mini

WaveScope's dynamic range can be tailored to your requirements as it is unique in its ability to accommodate aberrations of many hundreds of waves peak to valley (P-V), that are normally outside the range of interferometers and other wavefront sensors.

Analysis Software

A flexible, user extensible set of software tools has been designed for the efficient reduction and analysis of wavefront and image data. Written in the Tk/Tcl scripting language, a unified Hartmann data reduction package is presented in a user friendly graphical user interface (GUI). Virtually any type of sensor data may be reduced and analyzed to yield OPD, PSF, MTF and most other commonly used quantities.

Applications

WaveScope's large dynamic range allows measurements of diverse optical systems, from high quality astronomical mirrors to consumer optics and precision metal or ceramic components. In quality and process control situations you can use signals derived from WaveScope to control manufacturing processes.

Adaptive Optics

WaveScope can also form the heart of an adaptive optics system. With the addition of simple fore-optics, the wavefront at any pupil within an optical train can be measured. Collimated and point source laser diode references are available as options.

Proven Performance

The WaveScope product line has been developed from AOA wavefront sensors that have been used by some of the world's most prestigious research institutions and optical companies including: the US Air Force; French Atomic Energy Commission; Japanese Atomic Energy Research Institute; Japanese Central Research Laboratories; Contraves, Inc. and NASA.

NASA

An AOA wavefront sensor helped repair the Hubble Space Telescope (HST) by verifying the performance of the corrective optics. Today NASA continues to use our system in its benchmark tests of optical systems for HST.


WaveScope System Diagram

WaveScope System Diagram

View the on-line WaveScope manual

 

For sales in Europe, please contact: Optima Research Ltd.
For sales in all other countries, please contact us at info@aoainc.com

WaveScope, WaveLab are trademarks used by Adaptive Optics, Inc. All other trademarks and service marks are the property of their respective holders. WaveScope is protected under one or more of the following US patents: 4,490,039; 4,737,621; 5,629,76.

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